Daten: 10004045, XRF 17: Area analysis of an electronic circuit board
Kurz: X-ray fluorescence microanalysis has been used for a few years as a nondestructive method for testing of electronic circuit boards. The SPECTRO MIDEX M is a newly developed instrument which enables fast element mapping of large samples under the use of a micro-focus X-ray tube in connection with different collimators. The SPECTRO MIDEX M provides the ability to detect all relevant elements in the range of Na-U in one measurement simultaneously.
Nummer: XRF 17